CdSe量子点电化学发光检测全氟辛酸（PFOA）对DNA的损伤
DNA Damage due to PFOA Based on Electrochemiluminescence of CdSe Quantum Dot
DOI: 10.12677/AEP.2013.31B005, PDF, HTML, 下载: 3,167  浏览: 7,195  国家自然科学基金支持
作者: 李萌, 鲁理平*：北京工业大学环境与能源工程学院，北京市朝阳区平乐园100号，100124
关键词: 电化学发光；全氟辛酸；DNA损伤；硒化镉量子点； ECL sensor; PFOA; DNA Damage; CdSe QDs
摘要: 本文利用电化学发光方法研究了全氟辛酸(PFOA)对双链dsDNA的损伤，通过S-Au键将一端修饰巯基的双链dsDNA连接到金电极(Au)表面，再利用6-巯基己-1-醇（MCH）封闭电极表面，然后利用乙基-（3-二甲基丙基）碳二亚胺盐酸盐(EDC)和N-羟基琥珀酰亚胺(NHS)催化另一端由氨基修饰的双链dsDNA与羧基包裹的硒化镉量子点结合，从而将硒化镉量子点连接到金电极表面，得到CdSe/dsDNA/Au电极。通过原子力显微镜、X-射线光电子能谱等方法对电极表面进行表征，以过硫酸钾(K2S2O8)作为共反应剂，检测该DNA电化学传感器的电化学发光强度在PFOA损伤前后的变化。
>A new electrochemiluminescence (ECL) sensor for detecting dsDNA damage induced by Perfluorooctanoic Acid (PFOA) was presented in this paper. DNA was linked to the Au electrode by the S-Au bound, closed the electrode by MCH and then carboxyl group of the TGA-capped CdSe QDs was covalently conjugated to amino-DNA on the electrode through EDC and NHS. The morphology of the modified electrode (CdSe/dsDNA/Au) was characterized by XPS. Finally, in the presence of K2S2O8 as coreactant, ECL emission of the modified electrode is measured. The results indicate this design was effective for detection the DNA damage.
文章引用：李萌, 鲁理平. CdSe量子点电化学发光检测全氟辛酸（PFOA）对DNA的损伤[J]. 环境保护前沿, 2013, 3(1): 17-19. http://dx.doi.org/10.12677/AEP.2013.31B005

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