一种基于光电技术的大深径比微孔无损测量技术

A Non-Destructive Measurement Technology for Large Aspect Ratio Microholes Based on Optoelectronic Technology

摘要: 本设计为基于光电技术的大深径比微孔参数无损测量装置。旨在实现对直径为0.2~0.5 mm、深径比3~10的盲孔参数的精准检测。系统结构主要包括孔径测量装置、孔深测量装置和上位机界面实时数据显示模块。孔径测量装置采用CCD边缘检测技术，孔深测量装置采用耦合光纤探入孔内，光功率计光强反馈的非接触无损测量方式，深径比则通过上位机界面显示出来。系统的创新点为：整套装置为“CCD边缘检测孔径和光强反馈深度”的复合测量系统，且深径比数据能实时传输并显示在上位机界面上。

Abstract: This design presents a non-destructive measurement device for micro-hole parameters based on optoelectronic technology, specifically targeting blind holes with diameters ranging from 0.2 to 0.5 mm and aspect ratios between 3 and 10. The system architecture primarily comprises an aperture measurement unit, a depth measurement unit, and a real-time data display module on the host computer interface. The aperture measurement unit employs CCD edge detection technology, while the depth measurement unit utilizes a coupled optical fiber inserted into the hole, employing a non-contact, non-destructive measurement method with optical power meter intensity feedback. The depth-to-diameter ratio is displayed via the host computer interface. The innovation of the system lies in its integrated “CCD edge detection for diameter and optical intensity feedback for depth” composite measurement approach, with data transmitted and displayed in real time on the host computer interface.