标题:
半导体FT测试MES的流程定制功能的类设计Class Design of Process Planning in MES for Semiconductor Final Test
作者:
王仁, 叶桦, 刘浩波
关键字:
半导体FT测试, MES, 流程定制组合设计模式Semiconductor Final Test, MES, Process Planning Composite Pattern
期刊名称:
《Computer Science and Application》, Vol.6 No.11, 2016-11-24
摘要:
使用MES提高生产力已经成为半导体测试厂商的常见手段，而客户对FT测试流程及测试步骤的多样化需求要求MES软件必须具有灵活定制测试流程的功能，并在必要时能够由开发人员在MES软件中快速扩展出新种类的测试步骤。本文根据FT测试流程及其中各类测试步骤的业务特点进行了类设计，并使用“组合”设计模式使其具有优良的可扩展性。测试结果表明，基于该类设计的功能实现满足了流程测试步骤灵活制定、测试结果数据保存等功能，并具有十分优良的可扩展性，可较好的应用于半导体FT测试MES软件中。
MES has been widely used in Semiconductor test manufacturers for increasing productivity. The function of process planning has been required because of varied requirements to test process and procedures from customers. Additionally, classes of procedures should be able to be extended easily in MES by developer when it’s necessary. We designed the entity classes according to the requirements of test process and each test procedure, and extendibility has been achieved by applying composite pattern. Test results show that process can be customized and test data can be saved properly, the existed class formation can be extended easily as well. The developed function can be used in MES for final test properly.