基于Halcon的太阳能硅片缺陷检测
Surface Defects Inspection of Solar Cell Based on Halcon
DOI: 10.12677/MET.2013.24023, PDF, HTML,   
作者: 黄远民, 易 铭, 方 宁, 李秀忠, 李 敏：佛山职业技术学院机电工程系，佛山
关键词: 太阳能硅片；Halcon10.1；孔洞；脏污；断栅；Solar Wafer; Halcon10.1; Cavern; Smudge; Broken Gate
摘要: 随着太阳硅片朝着高性能方向发展，对太阳能硅片表面质量检测提出了更高的要求。基于机器视觉软件Halcon10.1可对太阳能硅片缺陷进行可靠的快速检测。本文利用德国MVTec公司的视觉软件Halcon10.1，实现对太阳能硅片隐裂、孔洞、脏污、断栅等缺陷快速地检测出来。实验表明，利用该技术能够提高对太阳能硅片崩边、隐裂、断栅等缺陷检测效率。
Abstract: The high-performance development direction of solar wafer raises higher requirements for its surface defects inspection while the vision software “Halcon10.1” is able to detect those defects reliably and rapidly. In this paper, we use the technology of the vision software “Halcon10.1” which is produced by the company of MVTec in Germany and realize the rapid defects detection including crack, cavern, smudge and broken so on and so forth which can be concluded that the application of this technology helps enhance the inspection efficiency.
文章引用：黄远民, 易铭, 方宁, 李秀忠, 李敏. 基于Halcon的太阳能硅片缺陷检测[J]. 机械工程与技术, 2013, 2(4): 118-122. http://dx.doi.org/10.12677/MET.2013.24023

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