高温微波材料电磁参数测量方法综述
A Review of Measuring Methods of Electromagnetic Parameters under High-Temperature
摘要: 在微波介质材料使用过程中,由于使用环境的影响,介质材料的电磁参数会发生变化,准确测量变温情况下的电磁参数成为重中之重。本文主要介绍变温介电常数的常用方法进行了综合论述。然后分别介绍了几种测量方法的基本原理以及发展概况。
Abstract: During the application of microwave dielectric materials, electromagnetic parameters of the dielectric materials will change under the influence of service conditions. Hence the accurate measurement of electromagnetic properties under the variation of temperature becomes critically important. This paper mainly introduces the commonly used methods of variable temperature permittivity measurement. Also the basic principles and development of numerous testing methods are presented respectively.
文章引用:王佩佩, 王群, 唐章宏, 李永卿. 高温微波材料电磁参数测量方法综述[J]. 物理化学进展, 2018, 7(2): 86-94. https://doi.org/10.12677/JAPC.2018.72011

参考文献

[1] Arai, M., Binner, J.G.P. and Cross, T.E. (1993) High Temperature Dielectric Property Measurements of Engineering Ceramics. Ce-ramic Transactions, 36, 483-492.
[2] Arai, M., Binner, J.G.P. and Cross, T.E. (1995) Correction of Errors Owing to Thermal Elon-gation of High Temperature Coaxial Probe for Microwave Permittivity Measurement. Electronics Letters, 31, 1138-1139. [Google Scholar] [CrossRef
[3] Bringhurst, S. and Iskander, M.F. (1996) Open-Ended Metallized Ceramic Coaxial Probe For High-Temperature Dielectric Properties Measurements. IEEE Transactions on Microwave Theory & Techniques, 44, 926-935. [Google Scholar] [CrossRef
[4] Agilent (2001) Agilent 85070D Dielectric Probe Kit. Agilent Product Note No. 5986-5330E.
[5] Kim, N., Yoon, J., Kim, D., et al. (2007) A High-Temperature Capable Planar-Type Coaxial Probe for Complex Permittivity Measurements Up to 40 GHz. Microwave Symposium. IEEE/MTT-S International, IEEE, 2007, 519-522.
[6] Kim, N., Yoon, J., Cho, S., et al. (2008) An Optimum Design Methodology for Planar-Type Coaxial Probes Applicable to Broad Temperature Permittivity Measurements. IEEE Transactions on Microwave Theory & Techniques, 56, 684-692. [Google Scholar] [CrossRef
[7] 孙珊珊, 黄卡玛. 双同轴高温垃圾复介电常数测量装置与方法[J]. 微波学报, 2015, 31(4): 89-92.
[8] Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Mate-rials at Microwave Frequencies and Temperatures to 1650 degree C. 1990.
[9] Friederich, P., Moore, R.L. and Larsen, J.W. (1991) Elevated Temperature Measurements of Permittivity and Permeability at Temperatures above 1000 Degrees C. Antennas and Propaga-tion Society International Symposium, 1991. AP-S. Digest. IEEE, Vol. 3, 1672-1675.
[10] 郭高凤. 高温介质材料介电性能终端短路法测试系统研究[D]. 电子科技大学, 2008.
[11] 王依超. 材料复介电常数超高温测试技术研究[D]. 电子科技大学, 2015.
[12] Dimitrakis, G.A., George, M., Poliakoff, M., et al. (2009) A System for Traceable Measurement of the Microwave Com-plex Permittivity of Liquids at High Pressures and Temperatures. Measurement Science & Technology, 20, 91-91. [Google Scholar] [CrossRef
[13] 唐宗熙, 张彪. 用自由空间法测试介质电磁参数[J]. 电子学报, 2006, 34(1): 189-192.
[14] Varadan, V.V., Hollinger, R.D., Ghodgaonkar, D.K., et al. (1991) Free-Space, Broadband Measurements of High-Temperature, Complex Dielectric Properties at Microwave Frequencies. IEEE Transactions on Instrumentation & Measurement, 40, 842-846. [Google Scholar] [CrossRef
[15] Macdonald, A., Friederich, P. and Moore, R.L. (1991) Millimeter Wave Dielectric Measurements at Elevated Temperatures. Antennas and Propagation Society International Symposium, 1991. AP-S. Digest. IEEE, Vol. 3, 1668-1671.
[16] 李元奇. 弓形法对吸波材料反射率的变温测试研究[D]: [硕士学位论文]. 成都: 电子科技大学, 2011.
[17] 王宝杰, 都文斌. 新型椭球腔用于低损材料相对介电常数超高温测量的研究[J]. 微波学报, 2017, 33(8): 310-313.
[18] Bakerjarvis, J., Janezic, M.D., Grosvenor, J.H.J., et al. (1993) Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability. Nasa Sti/recon Technical Report N, 93.
[19] Baker-Jarvis, J., Vanzura, E.J. and Kissick, W.A. (1990) Improved Technique for Determining Complex Permittivity with the Transmission/Reflection Method. IEEE Transactions on Microwave Theory and Techniques, 38, 1096-1103. [Google Scholar] [CrossRef
[20] Hauschild, T. and Knochel, R. (1996) Measurement of Complex Permittivity of Solids up to 1000. Journal Title, 3, 1687-1690.
[21] Gregory, A.P., Etzel, S. and Clarke, R.N. (2000) Precise Measurements on Dielectric Ref-erence Liquids over the Temperature Range 5-50/spl deg/C Using Coaxial Line Methods. Conference on Precision Electromagnetic Measurements Digest, Sydney, 14-19 May 2000, 455-456.
[22] Nassar, E.M., Lee, R. and Young, J.D. (1999) A Probe Antenna for in Situ Measurement of the Complex Dielectric Constant of Materials. IEEE Transactions on Antennas & Propagation, 47, 1085-1093. [Google Scholar] [CrossRef
[23] Bady, I. and Collins, T. (1963) Dielectric Constant Ferrites and Loss Tangent of Micro-wave at Elevated Temperatures. IEEE Transactions on Microwave Theory & Techniques, 11, 222-226. [Google Scholar] [CrossRef
[24] Hutcheon, R.M., De Jong, M.S., et al. (1989) A Technique for Rapid Scoping Measurement of RF Properties up to 1000 ˚C. Elecromagnetic Energy Reviews, 2, 46-50.
[25] Meng, B., Booske, J. and Cooper, R. (1995) A System to Measure Complex Permittivity of Low Loss Ceramics at Microwave Frequencies and over Large Temperature Ranges. Review of Scientific Instruments, 66, 1068-1071. [Google Scholar] [CrossRef
[26] Bringhurst, S.M. Nondestructive High Temperature Broadband Dielectric Properties Measurements—Analysis and Measurements.
[27] Cao, M., Hou, Z., Shi, X., et al. (2007) A Research on High-Temperature Permit-tivity and Loss Tangent of Low-Loss Dielectric by Resonant-Cavity Technique. High Technology Letters, 13, 279-282.
[28] Canos, A.J., Penaranda-Foix, F.L., Catala-Civera, J.M., et al. (2010) Measurement of Dielectric Properties at High-Temperatures in Real-Time with Cylindrical Cavity. Microwave Symposium Digest, Anaheim, 23-28 May 2010, 29.
[29] Catala-Civera, J.M., Canos, A.J., Plaza-Gonzalez, P., et al. (2015) Dynamic Measurement of Dielectric Properties of Materials at High Temperature During Microwave Heating in a Dual Mode Cylindrical Cavity. IEEE Transactions on Microwave Theory & Techniques, 63, 2905-2914. [Google Scholar] [CrossRef
[30] 冯萍丽, 韦高. Ku波段开腔电介质高温自动测量系统[J]. 强激光与粒子束, 2006, 18(8): 1323-1326.
[31] 聂瑞星. 准光学谐振腔法复介电常数变温测试系统研究[D]: [硕士学位论文]. 成都: 电子科技大学, 2012.
[32] 黎义, 李建保, 何小瓦. 采用谐振腔法研究透波材料的高温介电性能[J]. 红外与毫米波学报, 2004, 23(2): 157-160.
[33] Geyer, R.G., Kabos, P. and Baker-Jarvis, J. (2002) Dielectric Sleeve Resonator Techniques for Microwave Complex Permittivity Evaluation. IEEE Transactions on Instrumentation & Measurement, 51, 383-392. [Google Scholar] [CrossRef
[34] Heinola, J.M., Latti, K.P., Silventoinen, P., et al. (2004) A New Method to Measure Die-lectric Constant and Dissipation Factor of Printed Circuit Board Laminate Material in Function of Temperature and Frequency. Interna-tional Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces, Atlanta, 24-26 March 2004, 235-240.
[35] Guo, G. and Li, E. (2007) Stripline Resonator Method to Measure Complex Permittivity of Dielectric of Dielectric Sub-strate as a Function of Temperature. 7th International Symposium on Test and Measurement, Vol. 2, 1908-1910.
[36] 周杨. 带状线法透波材料高温介电性能测试技术研究[D]: [博士学位论文]. 成都: 电子科技大学, 2011.
[37] Baker-Jarvis, J., Janezic, M., Riddle, B., et al. (2001) Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials. NIST Technical Note 1, 520.
[38] 中华人民共和国国家技术监督局. GB5597.1999. 固体电介质微波复介电常数测试方法[P]. 北京: 中国标准出版社, 1999.
[39] Roussy, G., Thiebaut, J.M., Enameobiang, F., et al. (2001) Microwave Broadband Permittivity Meas-urement with a Multimode Helical Resonator for Studying Catalysts. Measurement Science & Technology, 12, 542. [Google Scholar] [CrossRef