X射线光栅暗场成像的机理分析与优化
Mechanism Analysis and Optimization of X-Ray Grating Dark Field Imaging
摘要: 在现有技术例如CT的设备中，利用X射线对物体进行扫描成像得到了广泛应用。但是传统的X射线成像利用材料对X射线的衰减特性来非破坏性场(Dark field)成像显著区别于明场(Brightfield)成像。暗场成像是利用非直射光(例如散射光、衍射光、折射光和荧光等)对物质进行成像的技术。传统X射线成像技术使用直射X射线对物体进行成像，即采用的是明场成像技术。本文研究利用普通的X射线源光栅暗场成像技术，用基于蒙特卡罗仿真软件设计光栅暗场成像系统，并对整个成像系统中影响成像质量的因素进行了详细的研究，在此基础上完善和优化系统，并对X射线源对X射线光栅暗场成像图像的影响、图像降噪方法和暗场成像图像的提取进行分析与优化。
Abstract: In devices of the prior art such as CT, X-ray imaging of objects has been widely used. However, tra-ditional X-ray imaging uses material’s attenuation characteristics for X-rays to distinguish non-destructive field imaging from brightfield imaging. Dark field imaging is a technique for imaging a substance using indirect light such as scattered light, diffracted light, refracted light, and fluorescence. Traditional X-ray imaging technology uses direct X-rays to image objects. That is to say, open-field imaging technology is used. This paper studies the use of ordinary X-ray source grating dark field imaging technology, and design of Grating Dark Field Imaging System based on Monte Carlo Simulation Software. The factors affecting the imaging quality of the whole imaging system are studied in detail. On this basis, the system is improved and optimized. The influence of X-ray source on the dark-field imaging image of X-ray grating, image denoising method and extraction of dark-field imaging image are analyzed and optimized.
文章引用：姜宇航, 秦旭磊, 孙振路. X射线光栅暗场成像的机理分析与优化[J]. 应用物理, 2018, 8(11): 489-504. https://doi.org/10.12677/APP.2018.811062

参考文献

[1] 李娜. EDXRF分析中光源与元素定量分析精度关系研究[D]: [硕士学位论文]. 长春: 长春理工大学, 2017.
[2] Pfeiffer, F., Bech, M., Bunk, O., et al. (2008) Hard-X-Ray Dark-Field Imaging Using a Grating Interferometer. Nature Materials, 7, 134-137. [Google Scholar] [CrossRef] [PubMed]
[3] 王乐生. 射线检测[M]. 北京: 机械工业出版社, 2009: 66-69.
[4] 王平. 基于LaBr3(Ce)双层闪烁晶体的软X射线探测方法研究[D]: [硕士学位论文]. 北京: 华北电力大学, 2017.
[5] Noda, D., et al. (2007) Fabrication of Diffraction Grating with High Aspect Ratio Using X-Ray Lithography Technique for X-Ray Phase Imaging. Japanese Journal of Applied Physics, 46, 849-851. [Google Scholar] [CrossRef] 
[6] Kafri, O. (1980) Noncoherent Method for Mapping Phase Objects. Optics Letters, 5, 555. [Google Scholar] [CrossRef] 
[7] Matsumoto, M., Takiguchi, K., Tanaka, M., Hunabiki, Y., Takeda, H., Momose, A., Utsumi, Y. and Hattori, T. (2007) Fabrication of Diffraction Grating for X-Ray Talbot Interferometer. Microsystem Technologies, 13, 543-546. [Google Scholar] [CrossRef] 
[8] David, C., et al. (2007) Fabrication of Diffraction Gratings for Hard X-Ray Phase Contrast Imaging. Microelectronic Engineering, 84, 1172-1177. [Google Scholar] [CrossRef] 
[9] Kafri, O. and Margalit, E. (1981) Double Exposure Moire Deflectometry for Removing Noise. Applied Optics, 20, 2344. [Google Scholar] [CrossRef] 
[10] 刘鑫, 等. 硬X射线相位光栅的设计与研制[J]. 物理学报, 2010, 59(10): 6927-6932.
[11] 张家骅. 放射性同位素X射线荧光分析[M]. 北京: 原子能出版社, 1981.
[12] 许淑艳. 蒙特卡罗方法在实验核物理中的应用[M]. 北京: 原子能出版社, 2006.
[13] 黑大千. 基于PGNAA技术的水溶液中元素成分及含量检测研究[D]: [硕士学位论文]. 南京: 南京航空航天大学, 2014.
[14] 唐桢, 等. 伽马射线辐射屏蔽效果实验的应用研究[C]//辐射防护分会2012年学术年会论文集. 太原: 辐射防护分会, 2012.
[15] 裴鹿成. 蒙特卡罗方法及其在粒子输运问题中的应用[M]. 北京: 科学出版社, 1980.
[16] Koo, B., et al. (2008) Parameter Optimization for a Grating-Based Phase Contrast X-Ray System. Pro-ceedings of SPIE—The International Society for Optical Engineering, 6913, Article ID: 691348. [Google Scholar] [CrossRef] 
[17] Keprt, J. and Bartoněk, L. (2007) Moire Deflectometry Used for Refractive Index Measurements. Proceedings of SPIE—The International Society for Optical Engineering, 6609.
[18] 张益海, 等. 锥束工业CT射束硬化校正方法[J]. 无损检测, 2017, 39(6): 8-12.
[19] 阮书州. 高能X射线物质识别的蒙特卡罗模拟[D]: [硕士学位论文]. 长春: 吉林大学, 2011.
[20] 于海林. 放射性模型井伽马能谱蒙卡模拟及单元层叠加原理验证[D]: [硕士学位论文]. 上海: 华东理工大学, 2012.
[21] 陈博, 等. X射线衍射增强成像中的信息分离和信息处理[J]. High Energy Physics and Nuclear Physics, 2006, 30(6): 587-590.
[22] Teng, S., et al. (2003) Uniform Theory of the Talbot Effect with Partially Coherent Light Illumination. Journal of the Optical Society of America a Optics Image Science & Vision, 20, 1747.
[23] 李野. 便携式低强度X射线实时成像系统关键技术研究[D]: [博士学位论文]. 长春: 长春理工大学, 2010.
[24] 刘有银. X射线成像影响因素及图像处理技术研究[D]: [硕士学位论文]. 长春: 长春理工大学, 2014.

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