一种基于ATE的提高DSP测试覆盖率方法

A Method of Improving DSP Test Coverage Based on ATE

摘要: DSP功能高覆盖率的测试是一个比较难的课题。本文以自主研发CATT-400大规模集成电路测试系统为测试平台，提出一种基于ATE (Automatic Test Equipment)的DSP的高覆盖率的测试方法；通过基于美国TI公司TMS320F28xx系列DSP，实现该测试方法开发验证，并实现自动测试设备与测试向量的自动匹配。该方法对于有微处理器的芯片测试有很大的推广意义。

Abstract: It is difficult to test the high coverage of DSP function. In this paper, the CATT-400 large-scale integrated circuit test system developed by ourselves is used as the test platform, and a high coverage test method based on ATE (automatic test equipment) DSP is proposed. Through the TMS320F28xx series DSP of TI Company in the United States, the test method is developed and verified, and the automatic matching between the automatic test equipment and the test vector is realized. This method is of great significance for chip test with microprocessors.