表面电极离子阱中五线阱的输运研究
Study on Shuttling of Five-Wire Trap in Surface Electrode Ion Trap
DOI: 10.12677/MOS.2023.125429, PDF,   
作者: 胡天杨, 王 旭*：贵州大学大数据与信息工程学院，贵阳 贵州
关键词: 量子计算机；离子囚禁；离子输运；直流电极；Quantum Computer； Ion Confinement； Ion Shuttling； DC Electrode
摘要: 量子计算机的扩展需要将多个子系统连接合成为可扩展的物理系统，离子作为量子比特载体，在各个子系统间传递量子信息，所以离子输运是实现在多个离子囚禁区域或多个子系统间的量子比特扩展方案中必要的操控手段，可见离子输运的重要性极高。因此，我们整理了一种用于计算离子输运过程中分段直流电极的时变电压的方法，在方法的设计中，我们不是从纯理论的角度来研究离子输运，还考虑了电子学的实际约束，且让实验方法更加简洁明了。最终的实验结果表明该方法可以让离子按预期的路线输运，这说明该方法是可行的，产生的直流电极电压是可靠的。
Abstract: The expansion of quantum computers requires the synthesis of multiple subsystems into scalable physical systems, and ions as qubit carriers transfer quantum information between subsystems. Therefore, ion shuttling is a necessary control means to realize the qubit expansion scheme in mul-tiple ion confinement regions or between multiple subsystems, which shows the importance of ion shuttling. Therefore, we have formulated a method for calculating the time-varying voltage of the segmented DC electrode during ion shuttling. In the design of the method, we do not study ion shut-tling from a purely theoretical point of view but also take into account the practical constraints of electronics, and make the experimental method more concise and clear. The experimental results show that the method can shuttle ions in the expected route, which shows that the method is feasi-ble and the generated DC electrode voltage is reliable.
文章引用：胡天杨, 王旭. 表面电极离子阱中五线阱的输运研究[J]. 建模与仿真, 2023, 12(5): 4707-4715. https://doi.org/10.12677/MOS.2023.125429

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