粗糙度对高温目标红外辐射偏振特性的影响研究
A Study of the Effect of Roughness on the Polarization Characteristics of Infrared Radiation from a High-Temperature Objective
DOI: 10.12677/jsta.2024.123031, PDF,  被引量   
作者: 高嘉乐：长春理工大学物理学院，吉林 长春
关键词: 自发辐射；粗糙表面；发射角；偏振度；Spontaneous Radiation； Rough Surface； Emission Angle； Polarization
摘要: 为了研究SiC材料在8~14 μm波段不同粗糙度下的红外自发辐射偏振特性，基于基尔霍夫定律和菲涅尔公式结合微面元模型构建了粗糙表面偏振自发辐射模型。仿真分析了碳化硅粗糙度以及发射角对偏振度的影响，并初步进行了试验验证。结果表明，随着粗糙度的增大，碳化硅的偏振度逐渐下降；随着发射角的增加其偏振度不断增大，两者相互叠加影响其偏振度的大小，最终通过实验结论与理论分析对比其趋势基本吻合。本文的研究成果为目标物体自发辐射偏振特性以及红外偏振成像的发展提供数据基础和理论指导。
Abstract: In order to study the polarization characteristics of infrared spontaneous radiation of SiC material in the 8~14 μm band with different roughness, a model of polarized spontaneous radiation from rough surfaces is constructed based on Kirchhoff’s law and Fresnel’s formula combined with the microfacet metamodel. The effects of silicon carbide roughness as well as emission angle on the polarizability are simulated and analyzed, and preliminary experimental verification is carried out. The results show that with the increase of roughness, the polarization of silicon carbide gradually decreases; with the increase of emission angle, its polarization increases, and the two superimposed on each other affect the magnitude of its polarization, and finally the experimental conclusions and theoretical analysis of the comparison of its trend basically coincide with each other. The research results of this paper provide data basis and theoretical guidance for the development of polarization characteristics of spontaneous radiation and infrared polarization imaging of target objects.
文章引用：高嘉乐. 粗糙度对高温目标红外辐射偏振特性的影响研究[J]. 传感器技术与应用, 2024, 12(3): 286-297. https://doi.org/10.12677/jsta.2024.123031

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