|
[1]
|
Liu, J., Xie, G., Wang, J., Li, S., Wang, C., Zheng, F. and Jin, Y. (2024) Deep Industrial Image Anomaly Detection: A Survey. Machine Intelligence Research, 21, 104-135. [Google Scholar] [CrossRef]
|
|
[2]
|
Tao, X., Gong, X., Zhang, X., Yan, S. and Adak, C. (2022) Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey. IEEE Transactions on Instrumentation and Measurement, 71, 1-21. [Google Scholar] [CrossRef]
|
|
[3]
|
Bergmann, P., Fauser, M., Sattlegger, D. and Steger, C. (2019) MVTEC AD—A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Long Beach, 15-20 June 2019, 9584-9592. [Google Scholar] [CrossRef]
|
|
[4]
|
Wyatt, J., Leach, A., Schmon, S.M. and Willcocks, C.G. (2022) AnoDDPM: Anomaly Detection with Denoising Diffusion Probabilistic Models Using Simplex Noise. IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, 19-20 June 2022, 649-655. [Google Scholar] [CrossRef]
|
|
[5]
|
Tax, D.M.J. and Duin, R.P.W. (2004) Support Vector Data Description. Machine Learning, 54, 45-66. [Google Scholar] [CrossRef]
|
|
[6]
|
Liu, Z., Zhou, Y., Xu, Y. and Wang, Z. (2023) SimpleNet: A Simple Network for Image Anomaly Detection and Localization. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Vancouver, 17-24 June 2023, 20402-20411. [Google Scholar] [CrossRef]
|
|
[7]
|
Defard, T., Setkov, A., Loesch, A. and Audigier, R. (2021) PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Localization. Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 12664 LNCS, 475-489. [Google Scholar] [CrossRef]
|
|
[8]
|
Roth, K., Pemula, L., Zepeda, J., Scholkopf, B., Brox, T. and Gehler, P. (2022) Towards Total Recall in Industrial Anomaly Detection. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, New Orleans, 18-24 June 2022, 14298-14308. [Google Scholar] [CrossRef]
|
|
[9]
|
Li, C.-L., Sohn, K., Yoon, J. and Pfister, T. (2021) CutPaste: Self-Supervised Learning for Anomaly Detection and Localization. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Nashville, 20-25 June 2021, 9659-9669. [Google Scholar] [CrossRef]
|
|
[10]
|
Zhang, H., Wang, Z., Wu, Z. and Jiang, Y.-G. (2023) DiffusionAD: Norm-Guided One-Step Denoising Diffusion for Anomaly Detection. [Google Scholar] [CrossRef]
|
|
[11]
|
Hadsell, R., Chopra, S. and LeCun, Y. (2006) Dimensionality Reduction by Learning an Invariant Mapping. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2, 1735-1742. [Google Scholar] [CrossRef]
|
|
[12]
|
Sun, Y., Cheng, C., Zhang, Y., Zhang, C., Zheng, L., Wang, Z. and Wei, Y. (2020) Circle Loss: A Unified Perspective of Pair Similarity Optimization. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Seattle, 13-19 June 2020, 6397-6406. [Google Scholar] [CrossRef]
|
|
[13]
|
Schroff, F., Kalenichenko, D. and Philbin, J. (2015) FaceNet: A Unified Embedding for Face Recognition and Clustering. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Boston, 7-12 June 2015, 815-823. [Google Scholar] [CrossRef]
|
|
[14]
|
Song, H. O., Xiang, Y., Jegelka, S. and Savarese, S. (2016) Deep Metric Learning via Lifted Structured Feature Embedding. Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Las Vegas, 27-30 June 2016, 4004-4012. [Google Scholar] [CrossRef]
|