指数分布下贝叶斯截尾序贯检验研究

Study on the Bayesian Truncated Sequential Test under Exponential Distribution

摘要: 针对具有“高可靠、长寿命”试验特点的计量型产品，为降低产品的抽样验收试验成本，研究了贝叶斯截尾序贯检验。在产品已通过鉴定试验的条件下，使用贝叶斯方法对鉴定试验数据进行分析，给出了指数分布下贝叶斯截尾序贯检验TB的求解步骤。通过与原验收试验方案进行比较研究，验证了贝叶斯截尾序贯检验TB的优良性。结果表明，对高质量水平的产品，所提出的检验TB在保持与原验收试验方案相当的通过验收试验概率的条件下，能够大幅缩减产品的平均试验时间及样本量截尾值，从而很好地降低了产品的抽样验收试验成本。

Abstract: For the sampling acceptance test of high-reliability and long-lifetime product, the Bayesian truncated sequential test is studied to reduce the test cost. By analyzing the test information with Bayesian method, the Bayesian truncated sequential test TB under exponential distribution is designed. The Bayesian truncated sequential test TB is validated by comparing with the original test plan. The results show that, for high quality products, the test plans proposed here can greatly reduce the expected test time and maximum sample size with the same probability of passing test as that of original test plan. So, it also can reduce the cost of sampling acceptance test.