作者:
DK Schroder
关键词:
Semiconductors
摘要:
Semiconductor Material and Device Characterizationis the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references. * New end of chapter problems * Outdated figures have been redone and replaced with current data * Up-to-date bibliography with over 1400 references * Professor Schroder is recognized as the authority in the field of semiconductor characterization
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