Kim, B.J., Lee, Y.W., Choi, S., Lim, J.W., Yun, S.J., Kim, H.T., Shin, T.J. and Yun, H.S. (2008) Micrometer X-Ray Diffraction Study of VO2 Films: Separation between Metal-Insulator Transition and Structural Phase Transition. Physical Review B, 77, Article ID: 235401.

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